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Title: LIGHTNING AND POWER SURGE PROTECTION - IN PREVENTING DAMAGES TO SENSITIVE ELECTRONIC AND PRODUCTION EQUIPMENT With the proliferation of modern electronics and computer systems in building facilities and factory automations system, power surge problem that cause damages in electronics cards is one of the most painful concern and loss in business. Apart of monetary loss, the business is suffering from other losses such as loss of productivity and valuable data. The talk aims to introduce a brief concept of power surge protection, which recommended by IEEE Standard 1100, and industry practice on how to apply the solutions to comply to the standard requirement. Title: DESIGN FOR X (DFX) AS BEST PRACTICE IN MANUFACTURING PROCESS, ASSEMBLY AND TEST
Design For X (DFX) is a one of the powerful tool or process employed during New Product Introduction (NPI) process. The ‘X’ typically refer to manufacturing process or initiatives that the company want to drive. Some of the examples of DFX include Design for Manufacturing (DFM), Design for Assembly (DFA) and Design for Testability. The objectives of the DFX is to ensure the manufacturing best practices, learnt lessons can be design in during NPI process. DFX can be deployed as early as product concept stage. The success of the DFX will ensure that the product is manufacturing friendly, ease of assembly and test. This in turn will improve the manufacturing productivity and quality. |
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Short Talk - Anaerobic Wastewater Treatment |
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Seminar Description Anaerobic treatment of wastewater has been practiced for more than a century. Use of anaerobic process for waste treatment has evolved from the earliest septic tanks to complex waste treatment systems involving modern technologies. In spite of its proven significance and potential development, the process has not been as widely used as it might deserve mainly due to some misconceptions and a lack of fundamental understanding of the process. |
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Short Talk - Image Colorization for Scanning Electron Microscope Images |
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Abstract Scanning electron microscope (SEM) is one of the most powerful instruments that can image and analyse bulk specimens. Usually, SEM images are in the grey scale level. With intensity different levels, mechanical contrast and artefacts can be detected properly. In this seminar, we propose to give an overview about the current colorisation techniques for general images and SEM images. A new colourisation is then proposed to improve mechanical contrast of the SEM grey images, and which is simple and user- friendly. Furthermore, the new developed technique for SEM images will be discussed and shown. |
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